Thin sample refractive index by transmission spectroscopy

Transmission spectroscopy and a small number of refractometer index measurements are combined to provide refractive index measurements of transparent samples ~50 um thick at hundreds of wavelengths with absolute accuracies <1 x 10(-4). Key to the technique is the use of independent index measurements to circumvent the need for an independent thickness measurement of the sample. The method was demonstrated on glass samples where fits to Cauchy curves had RMS accuracies <3 x 10(-5) from 415 to 1610 nm. Issues that must be addressed to reach this level of accuracy are discussed.