Current induced resistance changes were investigated in magnetic tunnel junctions with ultrathin Al-Ox barriers. The nonuniformity of the insulator induced a strong coupling between the two magnetic electrodes and no magnetoresistance. However, the current-voltage (I–V) characteristics at low bias voltages were consistent with a tunnellike behavior. At larger bias voltages, they showed an abrupt change of slope that was reversible for an opposite voltage polarity. The resistance versus current (R–I) curves exhibited reversible resistance changes that reached over 100%. We interpret this as controlled electromigration in local nanoconstrictions of the barrier.
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Deac et al. (2004) studied this question.
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