Performance degradation of functional oxide materials and interfaces is – besides structural changes – caused by changes of the chemical composition, the electronic structure and the surface and interface potentials. In‐situ preparation and analysis for LiCoO 2 thin films and for ITO/ZnPc interfaces are presented in this work. Sample stoichiometries, electronic structure and surface and interface potentials with photoelectron spectroscopy are analysed under well defined conditions.
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Ensling et al. (2005) studied this question.