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A pinhole camera is coupled with a Pilot-B scintillator and image-intensified TRW streak camera to study pinched electron beam profiles via observation of anode target bremsstrahlung. Streak intensification is achieved with an EMI image intensifier operated at a gain of up to 106 which allows optimizing the pinhole configuration so that resolution is simultaneously limited by photon-counting statistics and pinhole geometry. The pinhole used is one-dimensional and is fabricated by inserting uranium shims with hyperbolic curved edges between two 5-cm-thick lead blocks. The loss of spatial resolution due to the x-ray transmission through the perimeter of the pinhole is calculated and a streak photograph of a Gamble I pinched beam interacting with a brass anode is presented.
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D. J. Johnson (1977) studied this question.
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