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The Hall mobility of evaporated tellurium films was measured as a function of the temperature ranging from 77 to 300 K, and was compared with the theoretical values based on bulk single crystal theories. The measured Hall mobility was about one-tenth of the theoretical value. This deviation was accounted for by considering the potential barrier scattering model due to the grain boundaries of the polycrystalline films proposed by Petritz.
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Okuyama et al. (1973) studied this question.
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