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A spectrometer capable of examining a varying light source is described; it is designed to scan the wavelength range 200-850 nm in about 0·5 s. The information may be additive with successive wavelength scans so that a time-integrated spectrum can be finally presented on a pulse-height analyser; this is in digital form and may readily be converted into a form suitable for computer analysis. Examples of the application of the instrument to the study of the thermoluminescent spectra of various materials are presented.
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Harris et al. (1970) studied this question.
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