H-polarization diffraction by a thick metal-dielectric join

An analysis is presented of the H-polarization diffraction due to a material discontinuity formed by the junction of a thick dielectric half-plane with a metallic half-plane having the same thickness. This is accomplished by first considering the solution of several subproblems. These include the direct diffraction and coupling due to a plane wave incident on a loaded open-ended parallel plate waveguide and radiation and reflection by a waveguide mode. The final solution for diffraction by the metal-dielectric join is obtained by introducing a perfectly conducting stub within the loaded guide and subsequently using the generalized scattering matrix formulation with the stub brought to the waveguide opening. All the analysis relating to the subproblems is done by the dual integral equation approach. As expected, the final expressions involve several Wiener-Hopf split functions which are evaluated numerically or analytically.>