The adaptation of an electron microscope for reflexion and some observations on image formation

Designs are described of modified mechanical stage arrangements to allow the type E.M.3 electron microscopy (by the Metropolitan-Vickers Electrical Co. Ltd.) to be used for the glancing angle "reflexion" technique. The theoretical limit of resolution is discussed. For the experimental conditions used, a resolution of about 400 Å would be expected. The actual resolution obtained agrees with this figure.