A degradation mode in Mach-Zehnder semiconductor optical modulators with InGaAs/InAlAs MQWs is investigated. The main accelerating factors are the input optical power and the applied voltage in high stress tests. The main cause of degradation is found to be the destruction of the p-n junction on the side wall of the ridge waveguide. The time to failure is consequently expected to be >105 h under practical operating conditions in optical fibre transmission systems.
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Yuda et al. (1995) studied this question.
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