Two types of light-scattering patterns have been observed for polytetrafluoroethylene films. It has been postulated that these patterns arise from differences in the orientation of the optic axis with respect to the morphological unit of the structure. Films studied by the light-scattering technique have been examined by electron microscopy and the differences between the patterns are ascribed to differences in the orientation of the lamella with respect to the plane of the film.
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Rhodes et al. (1968) studied this question.
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