Lifetime measurements of VUV emitting levels in He, Ne, Ar and CO using the inelastic electron-photon delayed coincidence technique

The electron-photon delayed coincidence technique has been used to measure the lifetimes of excited states in He, Ne, Ar and CO that decay with the emission of VUV photons. The states with their measured lifetimes are: He, 5 1 P 7.4+or-0.4 ns, 6 1 P 14.0+or-0.3 ns, 7 1 P 21.6+or-1.2 ns; Ne, 3s(3/2) 1 20.5+or-0.7 ns; Ar, 4s(3/2) 1 7.9+or-0.6 ns; CO,C 1 Sigma + v=0<or=1.5+or-0.3 ns.