A midinfrared mass sensor based on high quality factor surface plasmon modes was designed, fabricated, and tested by infrared spectroscopy for the detection of nanometric layers of dielectric materials. Substrate removal below a metal mesh with period of 2 μm results in the coupling between degenerate surface plasmon modes on the two surfaces, resulting in a quality factor up to 33 for the antisymmetric mode. The presented substrateless metal mesh integrates mass sensing capability together with midinfrared spectroscopy, and is therefore of potential interest for substance-selective environmental and biomedical sensing applications
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Limaj et al. (2011) studied this question.
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