Raman spectral characterization of pure and fluorine‐doped vitreous silica material

Fluorine doped silica samples have been investigated by Raman spectroscopy. The results obtained allow us to propose a model for dopant incorporation in the silica network, involving the formation of SiO 3 F tetrahedron. A relationship between the intensity of the ν(Si‐F) stretching vibration band and the refractive index is presented.