X-ray diffraction allows the investigation of the atomic or molecular structure of materials. The combination of diffractometry with computerized tomography enables spatially resolved imaging of the diffraction properties of extended objects as described in more detail in a companion article [Harding et al., Med. Phys. 14, 515 (1987)]. We present measured diffraction patterns of some plastics and several biological materials, which allow further optimization of our method and the selection of suitable application areas.
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Kosanetzky et al. (1987) studied this question.