Single-phase, magnetically uniaxial Gd3-xBixFe5-yAlyO12films have been prepared by RF diode sputtering with RF substrate bias on single-crystal (Gd,Ca,Mg)3(Ga,Zr)5O12and amorphous substrates. Epitaxial growth is observed by annealing of amorphous films for lattice misfits <0.03Å (tensile stress). Intrinsic properties, such as lattice constant, saturation magnetization, and polar magnetooptic effects, compare well with liquid-phase epitaxial films of equal composition. Film imperfections originating from particles expelled from the ceramic targets cause some optical loss, increased coercivity and increased linewidth in X-ray diffraction.
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Krumme et al. (1984) studied this question.
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