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February 23, 1998Applied Physics Letters

Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

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Mark C. HersamMark C. HersamEötvös Loránd UniversityAHA. C. F. HooleUniversity of CambridgeSOS. J. O’SheaAgency for Science, Technology and Research

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Hersam et al. (1998) studied this question.

synapsesocial.com/papers/6a7105eb3ce530166bc2fdedhttps://doi.org/10.1063/1.120872
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