Detection of Low-Contrast Defects in Optical Films Using Sigma-Based Segmentation Technique

Optical film is an important component for LCDs, cell phones and other mobile devices. It is crucial to ensure an optical films is defect-free. However, derive from the inherent translucent characteristic, many images of defects of optical films are low contrast. Low-contrast defects are notorious for their difficult to be detected. As some low-contrast defects are barely visible to human being without special training, it is indeed a challenging task to capture low-contrast defect images. To overcome the difficulty, we thoroughly investigated various of imaging and lighting technologies. After images have been captured successfully, we devided the captured defects, based on their sizes, into two categories, i.e. macro defects and micro defects. To detect both large and small defects, we set up a macro inspection system and a micro inspection system, respectively. In the study, we provide an easy to understand approach to reveal low-contrast defects. The experimental results showed that the proposed inspection system and method is capable of detecting low-contrast defects such as uneven coatings, streaks, white spots and foreign particles.