This work reports a complete structural characterization of hydrothermal synthesized tubular Ni 3 Si 2 O 5 (OH) 4 correlating experimental X-ray diffraction (XRD) and transmission electron microscopy (TEM) results with theoretical nanotubular model characteristics. Nanotubes of single and multiple layers were evidenced by TEM. The d -spacing of the planes displayed in the bidimensional projection of the nanotube was measured in the high-resolution TEM image. An atomic model of the nanotube was constructed to reproduce experimental XRD and TEM data. Parameter lattice and reflection planes were obtained with theoretical calculus. Finally, it was calculated a high-resolution TEM image from atomic model. Both, experimental and calculated high-resolution images show an excellent match.
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Álvarez et al. (2011) studied this question.
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