We report perpendicular spin-wave resonance measurements in single crystal YIG films at 77 K and several frequencies. For films of thickness 0.9 μm the SWR mode positions follow a quadratic (n2) dependence. For 0.37 μm thick films sizeable deviations appear at n > 4. Further, these deviations increase with microwave frequency. Effects of annealing these films at several temperatures between 700 and 1250 °C have also been studied. It is suggested that the data can be roughly understood by invoking a diffusion region, of varying magnetization, at the YIG-substrate interface.
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Bhagat et al. (1973) studied this question.
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