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A technique is developed for direct determination of the plane wave reflection properties of plane layered media. The approach is applicable for media containing a high-index absorber layer. A circular waveguide aperture is used to measure the near field scattering from the external medium. The analytical development results in a set of Smith chart contours from which the reflection properties of the medium can be determined from the measured waveguide reflection coefficient. The approach is demonstrated with measurements of a ferrite absorber panel.
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Rudduck et al. (1974) studied this question.
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