The unmanageably large size of reference traces has spurred the development of sophisticated trace reduction techniques. In this paper we present two new algorithms for trace reduction -Safely Allowed Drop (SAD) and Optimal LRU Reduction (OLR). Both achieve high reduction factors and guarantee ezact simulations for common replacement policies and for memories larger than a user-defined threshold. In particular, simulation on OLR-reduced traces is accurate for the LRU replacement algorithm, while simulation on SAD-reduced traces is accurate for the LRU and OPT algorithms. OLR also satisfies an optimality property: for a given trace and memory size it produces the shortest possible trace that has the same LRU behavior as the original for a memory of at least this size.
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Kaplan et al. (1999) studied this question.
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