Shake-off processes in photoionization and Auger transition for rare gases irradiated by soft X-rays

Branching ratios of multiply charged Ne, Ar, Kr and Xe ions produced following soft X-ray absorption by the rare gases have been measured using a time-of-flight mass spectrometer and monochromatized synchrotron radiation. Ratios of double, triple and quadruple valence photoionization to single valence photoionization, of multiple Auger transitions to the normal Auger transition from a core hole or core-valence two-hole state, and of the multiple photoionization with a core hole to single core photoionization have been determined using the measured branching ratios of the multiply charged ions.