Measurements on MIC dielectrics have been made by applying the theory of resonant cavities to either wholly or partly metallized substrates. Two different schemes of coupling are employed, depending upon the metallization. Errors occur in the derived value of /spl epsi/, due to the coupling, and are of opposite sense for the two methods discussed. They may be averaged to improve the overall measurement precision (0.5 percent).
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Ladbrooke et al. (1973) studied this question.
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