SUMMARY The scanning transmission electron microscope is of quite recent origin, and it is only in the last few years that it has been shown that this instrument is capable of giving the same high resolution as the conventional electron microscope. In this article we examine the conditions necessary for the achievement of high resolution and also the various modes of contrast which can be obtained from this instrument. Finally, we suggest other ways in which the microscope can be used in future investigations.
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Albert V. Crewe (1974) studied this question.
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