In-plane scattering in Ti-indiffused LiNbO3 optical waveguides arises from several possible sources. The importance of the different sources changes as a function of the total diffusion time used in waveguide fabrication. This letter describes detailed observations of different sources and shows that at long diffusion times the in-plane scattering is dominated by an increasing density of misfit dislocations growing in the waveguiding layer.
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Armenise et al. (1984) studied this question.
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