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A Scanning Surface Potential Microscopic (SSPM) instrument was built by modifying a commercial atomic force microscope (AFM), Seiko SFA 300 with a SPI 3600 probe station. Distribution of surface potentials on test samples microlithographically prepared and on mixed Langmuir-Blodgett (LB) films coated on a vapor-deposited gold film could be imaged in a x-y spatial resolution less than 1 μm and compared with AFM images observed on the same samples.
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Fujihira et al. (1992) studied this question.
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