The authors present a set of techniques making it possible to perform heavy-ion testing on present 32-bit microprocessors. In particular, they study how the program executed by the circuit during the irradiation can modify the calculated upset cross-section. The approach is illustrated by experimental results obtained on both the Motorola 68020 microprocessor and its coprocessor 68882, by means of particle accelerators as well as a Cf/sup 252/ fission-decay source.>
No takes yet. Share an insight, caveat, or question.
Velazco et al. (1992) studied this question.
Synapse has enriched one closely related paper. Consider it for comparative context: