Direct observation of conduction electron beam transmission through a Bi intercrystalline boundary

A technique for studying conduction electron/interface interactions is used to study reflection and refraction of an electron beam at a Bi intercrystalline boundary. The technique involves scanning a small laser spot over the surface of a bicrystal, exciting conduction electrons locally, and using a magnetic field to focus excited electrons onto a fixed point contact (an electron collector), after the electrons have been reflected from, or transmitted through, the intercrystalline boundary. Refraction of conduction electrons, high bicrystal interface transparency, and a correlated electron transmission through the interface have all been observed.