We introduce an inversion procedure for the characterization of a nanostructure from near-field intensity data. The method proposed is based on heuristic arguments and makes use of evolution strategies for the solution of the inverse problem as a nonlinear constrained-optimization problem. By means of some examples we illustrate the performance of our inversion method. We also discuss its possibilities and potential applications.
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Macı́as et al. (2004) studied this question.
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