This paper considers the possibility of numerical generation of pulse breakdown voltage random variable in SF6 gas. A theoretically constructed model was tested at low, medium, and high values of pd product (pressure × interelectrode distance), ranging from 0.1 mbar mm to 50 bar mm. Numerical generation of the statistic sample of the pulse breakdown voltage random variable was performed in homogenous and nonhomogenous fields. Variable experiment parameters were the pulse rise rates (from 1 to 400 kV/μs). Obtained results indicate that the proposed theoretical-numerical model is absolutely satisfactory at high values of pd product (10-50 bar mm), which is the very region of SF6 gas application. At lower values of pd product (less than 10 bar mm), there are certain deviations between a numerically generated statistic sample of the pulse breakdown voltage random variable and the one obtained experimentally. However, this deviation is not relevant from the aspect of engineering practice.
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Stanković et al. (2014) studied this question.
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