Texture and Microstructure Analysis with High-Energy Synchrotron Radiation

High-energy synchrotron radiation with wavelengths in the range of 0.1 Å is an excellent tool to measure the orientational and spatial distribution of crystallites in polycrystalline materials of any kind. A particular “sweeping” method for continuous imaging of texture and microstructure with high resolving power is described. In “grain-resolved” structures, the orientation stereology of the grains can thus be obtained. High-energy synchrotron radiation has penetration depths in most materials comparable with that of neutrons. It is thus very well suited for the study of big samples and for non-destructive testing of complex technological components.