The magnetic and structural properties of rf sputtered CO1-x-yPtxTiythin films are presented. At low argon pressure (PAr= 3×10-3Torr) samples with high coercive field and high in plane loop squareness S is obtained, Hcbeing maximum for x = 0.17. Deposition under an applied d.c. field permitted to increase Hcwhile the substitution of a small amount of Ti improves S. For higher PAr(PAr= 8×10-3Torr), a perpendicular anisotropy field Hp is developped. These results are correlated with the structural properties. For 0.1c, S and Hp are essentially related to the respective evolution of these two regions.
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Suran et al. (1986) studied this question.
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