The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 nm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found.
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López-Rı́os et al. (1995) studied this question.
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