Fast fault detection method for modular multilevel converter semiconductor power switches

This study proposes a new fault detection method for modular multilevel converter (MMC) semiconductor power switches. While in common MMCs, the cells capacitor voltages are measured directly for control purposes, in this study voltage measurement point changes to the cell output terminal improving fault diagnosis ability. Based on this measurement reconfiguration, a novel fault detection algorithm is designed for MMCs semiconductor power switches. The open circuit and short circuit faults are detected based on unconformity between modules output voltage and switching signals. Simulation and experimental results confirm accurate and fast operation of the proposed method in faulty cell diagnosis. Implementation simplicity, no need to extra voltage measurements and multi faults detection ability are some other advantages of the proposed method.