Polymer light-emitting field-effect transistors (LEFETs) require high and balanced electron and hole mobilities to achieve high current densities. Here we demonstrate a novel gate dielectric for polymer LEFETs that enables mobilities of 0.01cm2∕Vs for both electrons and holes. The low-k dielectric polycyclohexylethylene is placed in direct contact with the poly(9,9-di-n-octylfluorene-alt-benzothiadiazole) semiconductor. A second dielectric layer comprising the high-k material poly(vinylidene fluoride-trifluoroethylene) is used to apply a high electric field onto the low-k dielectric layer. The attainable electron-hole recombination current in such optimized polymer LEFETs is measured and the implications for achieving electrically pumped lasing in a LEFET are discussed.
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Naber et al. (2008) studied this question.
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