High-resolution photoelectron spectrometry of selectedns’ andnd’ autoionization resonances in Ar, Kr, and Xe

Photoionization cross sections ({σ}) and photoelectron angular distribution parameters ({β}) across the (ns',nd') autoionization resonances for Ar, Kr, and Xe have been measured with photon resolution widths as low as 0.023 {} by means of synchrotron-based photoelectron spectroscopy. The experimental results are compared with those obtained by other experimental techniques and theoretical results. The enhanced resolution allows a redetermination of the width of the ns' resonances.