The influence of VLSI technology evolution on radiation-induced latchup in space systems

Changes in technology and device scaling have generally increased the sensitivity of VLSI devices to latchup from single interactions of heavy particles in space. This paper discusses latchup mechanisms, comparing latchup from heavy particles in space with electrically induced latchup, which has been more widely studied. The effects of technology changes and device scaling on latchup susceptibility are discussed as well. Test methods and the interpretation of latchup results are also included, along with predictions of the effects of device evolution and scaling on latchup susceptibility in space.