The sensitivity of very large scale integrated circuits to alphaparticle-induced soft errors is considered. It is shown that alpha flux levels in packages are unlikely to be reduced below 0.001-0.01 α/cm2-h and that device design and technology changes will offer the most significant opportunities for soft error improvement. The use of error detection and correction (EDAC) will become more widespread in the next decade. Accelerated testing methods and additional sources of soft errors in VLSI are discussed.
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T.C. May (1979) studied this question.
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