In situ Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms, Sasaki, Takuo, Suzuki, Hidetoshi, Sai, Akihisa, Lee, Jong-Han, Takahasi, Masamitu, Fujikawa, Seiji, Arafune, Koji, Kamiya, Itaru, Ohshita, Yoshio, Yamaguchi, Masafumi
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Sasaki et al. (2009) studied this question.
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