A novel analysis method for analog circuits test and diagnosis is described in this paper. Diagnosis hypotheses are represented and fuzzy math is used to express the diagnosis hypotheses and strategy. Based on it, new equivalent fault model is presented and used for test node selection and design for test. Especially, parametric fault test for linear analog circuits with tolerance analysis is presented using both sensitivity method and fuzzy analysis method.
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Wang et al. (2005) studied this question.
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