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Polycrystalline Pd and amorphous PdTa films on Al substrates were studied by a variable energy positron beam and by Rutherford backscattering. Since positron diffusion in the overlayers is limited, the range follows directly from the Doppler broadening as a function of incident positron energy. To observe possible effects of positron backscattering, a sandwich of Al/Pd/Al was studied as well. It was found that the mean penetration depth is not described well by z̄(E)=A(μg/cm2)×En(E), if A and n are assumed to be material and energy independent.
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Nielsen et al. (1990) studied this question.
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