The current state of the art in one of the most promising techniques of X-ray spectral analysis, namely, total reflection X-ray fluorescence analysis (TXRF), is summarized. The underlying physical processes, including reflection, refraction, total external reflection (TER) of X-rays, and formation of standing waves by TER, are considered. The construction and crucial components of a modern energy-dispersive TXRF spectrometer, involving X-ray tubes, monochromators, detectors, and reflectors, are described. Examples of analytical application of TXRF are given. High efficiency of this technique for qualitative and quantitative chemical analysis of liquids and solids of various natures is demonstrated. The main research trends in surface analysis and investigation of surface layers of solids by TXRF are discussed.
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Н. В. Алов (2011) studied this question.
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