A three-terminal dielectric cell based on a hemispherical design is constructed for low-temperature measurements of dielectric permittivity. The cell has a small sample volume, is geometrically stable, and shows no frequency dependence of capacitance. Measurements on test samples are presented showing both cell constant stability data and the linearity of measured capacitance with dielectric constant.
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Hayden et al. (1978) studied this question.
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