The use of synchrotron radiation–based spectroscopy to investigate electronic and bonding structures of nanostructured materials is reviewed with focuses on the X-ray absorption spectroscopy (XAS), valence-band photoemission spectroscopy (VB-PES), and scanning photoelectron microscopy (SPEM) measurements. This review addresses the current status of synchrotron radiation–based nanoscale characterization of carbon-based and ZnO nanomaterials. Current research works that are relevant to this rapidly evolving experimental area and implications in nanoscience and nanotechnology are emphasized.
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Ray et al. (2006) studied this question.