Enhanced Absorption in Laser-Crystallized Silicon Thin Films on Textured Glass

This paper reports enhanced absorption in laser-crystallized Si thin films on abrade-textured glass. The Si film on textured glass has large high-quality grains of several hundred micrometers in width and up to several centimeters in length. A combination of glass texturing, rear Si texturing, white paint rear reflector, and front moth-eye antireflection foil on a 10-μm-thick Si film (onSiOₓ/SiNₓ/SiOₓintermediate layer) shows a large broadband absorption enhancement with potential short-circuit current densities up to 29.5 mA/cm2(26.1% enhancement as compared with a planar reference).