A device for automated measurement of the permeability of thin films is described. Specimens are placed in a high frequency band magnetic field, and the induced emf measured using a differential detection coil, with a damping resistance inserted to prevent resonance. The frequency is varied to find the μ-f characteristic. The device was used to measure the characteristic of a sputtered Sendust film 4 mm by 4 μm up to 100 MHz; measurements required only a few minutes' time.
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Hayakawa et al. (1985) studied this question.
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