Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C 1s core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphens through the chemical contrast images of SPEM.
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Kim et al. (2008) studied this question.
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