NiO as a test case for high resolution resonant inelastic soft x-ray scattering

Resonant inelastic x-ray scattering (RIXS) at the L 2,3 edges of 3d transition metal compounds has recently become a high resolution spectroscopic technique thanks to improvements in the instrumentation. We have chosen the prototypical case of NiO to explore the various levels of interpretation applicable to L 3 RIXS spectra of strongly correlated electron systems. Starting from a set of experimental data measured across the Ni L 3 absorption edge with 550 meV combined energy resolution, we analyse the rich spectral structure within an atomic framework. The spectra can be separated into dd and charge transfer excitation regions. The dd excitations can be interpreted and well reproduced within a crystal field model. The charge transfer excitations are analysed through the comparison with calculations made in the Anderson impurity model. A series of parameters belonging to the proposed models (crystal field strength, charge transfer energy, hybridization integrals) can thus be extracted in a very direct and unambiguous way.