Spin-transfer switching current distribution and reduction in magnetic tunneling junction-based structures

Spin transfer switching current distribution within a cell and switching current reduction were studied at room temperature for magnetic tunnel junction-based structures with resistance area product (RA) ranged from 10 to 30 /spl Omega/-/spl mu/m/sup 2/ and TMR of 15%-30%. These were patterned into current perpendicular to plane configured nanopillars having elliptical cross sections of area /spl sim/0.02 /spl mu/m/sup 2/. The width of the critical current distribution (sigma/average of distribution), measured using 30 ms current pulse, was found to be 3% for cells with thermal factor (KuV/k/sub B/T) of 65. An analytical expression for probability density function p(I/I/sub c0/) was derived considering a thermally activated spin transfer model, which supports the experimental observation that the thermal factor is the most significant parameter in determining the within-cell critical current distribution. Spin-transfer switching current reduction was investigated through enhancing effective spin polarization factor /spl eta//sub eff/ in magnetic tunnel junction-based dual spin filter (DSF) structures. The intrinsic switching current density (J/sub c0/) was estimated by extrapolating experimental data of critical current density (J/sub c/) versus pulse width (/spl tau/), to a pulse width of 1 ns. A reduction in intrinsic switching current density for a dual spin filter (DSF: Ta/PtMn/CoFe/Ru/CoFeB/Al2O3/CoFeB/spacer/CoFe/PtMn/Ta) was observed compared to single magnetic tunnel junctions (MTJ: Ta/PtMn/CoFe/Ru/CoFeB/Al2O3/CoFeB/Ta). J/sub c/ at /spl tau/ of 1 ns (/spl sim/J/sub c0/) for the MTJ and DSF samples were 7/spl times/10/sup 6/ and 2.2/spl times/10/sup 6/ A/cm/sup 2/, respectively, for identical free layers. Thus, a significant enhancement of the spin transfer switching efficiency is seen for DSF structure compared to the single MTJ case.