Impact of Series Resistance on Bulk CMOS Current Matching Over the 5–300K Temperature Range

This letter presents the impact of source/drain series resistance on the matching of bulk nMOS and pMOS field-effect transistor current over the 5-300K temperature range. A new method to extract series resistance is introduced, and we show experimentally that current variations, considering series resistance, increase as temperature decreases. Moreover, we propose a new approach to calculate the current mismatch based on MOSFET parameters and series resistance. The approach predicts the current variation better than the conventional model over the examined temperatures.